TY - CONF T1 - Reliability improvement of obstacle detection in an IR barrier T2 - 32nd IEEE International Annual Conference on Industrial Electronics, Control and Instrumentation (IECON 2006) Y1 - 2006 A1 - J.J. Garcia A1 - Ureña, J. A1 - Manuel Mazo A1 - Cristina Losada-Gutiérrez A1 - Álvaro Hernández A1 - Jose Antonio Jimenez A1 - Ana Jimenez A1 - Carlos De Marzziani A1 - Fernando J. Álvarez JF - 32nd IEEE International Annual Conference on Industrial Electronics, Control and Instrumentation (IECON 2006) CY - Paris, Francia VL - CD SN - 1-4244-0136-4 ER -