TY - JOUR T1 - Calibration of Line-Scan Cameras JF - IEEE Transactions on Instrumentation and Measurement Y1 - 2010 A1 - Carlos Andres Luna A1 - Manuel Mazo A1 - Jose L. Lazaro A1 - Juan F. Vazquez AB - This paper presents a novel method for calibrating line-scan cameras using a calibration pattern comprising two parallel planes with lines that can be described using known equations. Using pattern geometry and a line that is captured by a line-scan camera, we calculate the 3-D coordinates of the points corresponding to the straight lines of a pattern that is captured by the line-scan camera. These coordinates are used to obtain the intrinsic and extrinsic parameters of the line scan using a standard calibration procedure that is based on a recursive least squares method. In this paper, the procedure of calibration and the results obtained for a specific line scan will be shown; specifically, the obtained median residual error is 0.28 pixel. Also, the repetitiveness of the calibration process was verified for a sequence of 500 times. PB - IEEE Instrumentation and Measurement Society VL - 59 UR - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5286844&tag=1 IS - 8 ER -