Title | Calibration of Line-Scan Cameras |
Publication Type | Journal Article |
Año de publicación | 2010 |
Autores | Luna, CA, Mazo, M, Lazaro, JL, Vazquez, JF |
Idioma de publicación | English |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volumen | 59 |
Número | 8 |
Páginas | 2185 - 2190 |
Fecha de publicación | 07/2010 |
Editorial | IEEE Instrumentation and Measurement Society |
Rank in category | 17/56 |
JCR Category | Instruments & Instrumentation |
JCR Impact Factor | 5.468 |
ISSN | 0018-9456 |
URL | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5286844&tag=1 |
DOI | 10.1109/TIM.2009.2031344 |
Abstract | This paper presents a novel method for calibrating line-scan cameras using a calibration pattern comprising two parallel planes with lines that can be described using known equations. Using pattern geometry and a line that is captured by a line-scan camera, we calculate the 3-D coordinates of the points corresponding to the straight lines of a pattern that is captured by the line-scan camera. These coordinates are used to obtain the intrinsic and extrinsic parameters of the line scan using a standard calibration procedure that is based on a recursive least squares method. In this paper, the procedure of calibration and the results obtained for a specific line scan will be shown; specifically, the obtained median residual error is 0.28 pixel. Also, the repetitiveness of the calibration process was verified for a sequence of 500 times. |